On defects, they've proven within the micron scale that they include no new defects for the layer transferred for the SmartSiC, on the other hand long run operate to extend that to the full wafer would supply certainty with the macro pattern. The chance for unbiased validation of those substrates https://www.facebook.com/permalink.php?story_fbid=pfbid0aqTqdMZud1GurkviKFTsNMKJHGZD1XDeLV9TroJqKzjZXLCFuy6MbJM8Riig5JL5l&id=61562415773754&__cft__[0]=AZVTVgz8Mww2Hsm9I5R3Asxv-ZWuNuccGtCDDqo3waDsc1VVuL602otgWkBywzpsP-4pGgMnLjGCMAto7dNMzn4e1GKTc03ckuV1hXYWJYV8Yvs8HqoHyLmrjCA9vLd5xQtgedxK1-YGkbP9w_k9m-gD8oM-pB2AfImmaBOTeYBn6MW0LWf5rjJ1g3JeQ0OICAnSCidS5z66WXh0wKzurqM-&__tn__=%2CO%2CP-R